Design, verification and implementation of IEEE 1149.7 test access port

• 主要作者: Ganesh Janani
• 其他作者: Gwee Bah Hwee
• 格式: Theses and Dissertations
• 語言: English
• 出版: 2018
• 主題: DRNTU::Engineering::Electrical and electronic engineering
• 在線閱讀: http://hdl.handle.net/10356/73131
• 機構: Nanyang Technological University

Standard access methods for Design for Testsbility (DfT) rely on the IEEE 1149.1 (JTAG) Test Access Port (TAP) controllers and associated collaterals. While the IEEE 1149.1 standard is a proven industry approach and has served the needs of DfT well, modern system on a chip (SoC) designs bring with i...