Design, verification and implementation of IEEE 1149.7 test access port

• المؤلف الرئيسي: Ganesh Janani
• مؤلفون آخرون: Gwee Bah Hwee
• التنسيق: Theses and Dissertations
• اللغة: English
• منشور في: 2018
• الموضوعات: DRNTU::Engineering::Electrical and electronic engineering
• الوصول للمادة أونلاين: http://hdl.handle.net/10356/73131
• المؤسسة: Nanyang Technological University

Standard access methods for Design for Testsbility (DfT) rely on the IEEE 1149.1 (JTAG) Test Access Port (TAP) controllers and associated collaterals. While the IEEE 1149.1 standard is a proven industry approach and has served the needs of DfT well, modern system on a chip (SoC) designs bring with i...