Design, verification and implementation of IEEE 1149.7 test access port

• المؤلف الرئيسي: Ganesh Janani
• مؤلفون آخرون: Gwee Bah Hwee
• التنسيق: Theses and Dissertations
• اللغة: English
• منشور في: 2018
• الموضوعات: DRNTU::Engineering::Electrical and electronic engineering
• الوصول للمادة أونلاين: http://hdl.handle.net/10356/73131

Standard access methods for Design for Testsbility (DfT) rely on the IEEE 1149.1 (JTAG) Test Access Port (TAP) controllers and associated collaterals. While the IEEE 1149.1 standard is a proven industry approach and has served the needs of DfT well, modern system on a chip (SoC) designs bring with i...