Improvement of scanning ion-conductance microscopy for bio-analytical application

Scanning ion-conductance microscopy (SICM) is an emerging microscope technique among the family of scanning probe microscopy (SPM). Since the invention of scanning tunneling microscopy (STM) in 1981, SPM has widened their capabilities and opened the understanding of small things. The most promising...

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Bibliographic Details
Main Author: Kim, Joonhui
Other Authors: Cho Nam-Joon
Format: Theses and Dissertations
Language:English
Published: 2018
Subjects:
Online Access:http://hdl.handle.net/10356/73734
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Institution: Nanyang Technological University
Language: English