Development of micro-strip GaN-on-SiC backside via holes process

GaN-on-SiC HEMTs have gained remarkable attention due to their potential to revolutionize power and RF electronics as it has highest output power density amongst all solid state semiconductor devices Although much progress in HEMTs has been made, via-holes remain critical routes to improve DC and RF...

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Bibliographic Details
Main Author: Yu, Zhuoran
Other Authors: Wang Hong
Format: Final Year Project
Language:English
Published: 2018
Subjects:
Online Access:http://hdl.handle.net/10356/74697
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Institution: Nanyang Technological University
Language: English
Description
Summary:GaN-on-SiC HEMTs have gained remarkable attention due to their potential to revolutionize power and RF electronics as it has highest output power density amongst all solid state semiconductor devices Although much progress in HEMTs has been made, via-holes remain critical routes to improve DC and RF electrical performance for micro-strip circuits. From this project, you can understand how the Via hole was fabricated in the cleanroom by a lot of experiments like Lapping, Dry etching, photolithograph, Ni Plating and so on. My project will mainly concentrate on the processes of SiC lapping and dry etching. The details will be introduced in the following chapters.