Development of micro-strip GaN-on-SiC backside via holes process

GaN-on-SiC HEMTs have gained remarkable attention due to their potential to revolutionize power and RF electronics as it has highest output power density amongst all solid state semiconductor devices Although much progress in HEMTs has been made, via-holes remain critical routes to improve DC and RF...

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Main Author: Yu, Zhuoran
Other Authors: Wang Hong
Format: Final Year Project
Language:English
Published: 2018
Subjects:
Online Access:http://hdl.handle.net/10356/74697
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-746972023-07-07T16:32:41Z Development of micro-strip GaN-on-SiC backside via holes process Yu, Zhuoran Wang Hong School of Electrical and Electronic Engineering Temasek Laboratories @ NTU DRNTU::Engineering GaN-on-SiC HEMTs have gained remarkable attention due to their potential to revolutionize power and RF electronics as it has highest output power density amongst all solid state semiconductor devices Although much progress in HEMTs has been made, via-holes remain critical routes to improve DC and RF electrical performance for micro-strip circuits. From this project, you can understand how the Via hole was fabricated in the cleanroom by a lot of experiments like Lapping, Dry etching, photolithograph, Ni Plating and so on. My project will mainly concentrate on the processes of SiC lapping and dry etching. The details will be introduced in the following chapters. Bachelor of Engineering 2018-05-23T03:38:02Z 2018-05-23T03:38:02Z 2018 Final Year Project (FYP) http://hdl.handle.net/10356/74697 en Nanyang Technological University 50 p. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic DRNTU::Engineering
spellingShingle DRNTU::Engineering
Yu, Zhuoran
Development of micro-strip GaN-on-SiC backside via holes process
description GaN-on-SiC HEMTs have gained remarkable attention due to their potential to revolutionize power and RF electronics as it has highest output power density amongst all solid state semiconductor devices Although much progress in HEMTs has been made, via-holes remain critical routes to improve DC and RF electrical performance for micro-strip circuits. From this project, you can understand how the Via hole was fabricated in the cleanroom by a lot of experiments like Lapping, Dry etching, photolithograph, Ni Plating and so on. My project will mainly concentrate on the processes of SiC lapping and dry etching. The details will be introduced in the following chapters.
author2 Wang Hong
author_facet Wang Hong
Yu, Zhuoran
format Final Year Project
author Yu, Zhuoran
author_sort Yu, Zhuoran
title Development of micro-strip GaN-on-SiC backside via holes process
title_short Development of micro-strip GaN-on-SiC backside via holes process
title_full Development of micro-strip GaN-on-SiC backside via holes process
title_fullStr Development of micro-strip GaN-on-SiC backside via holes process
title_full_unstemmed Development of micro-strip GaN-on-SiC backside via holes process
title_sort development of micro-strip gan-on-sic backside via holes process
publishDate 2018
url http://hdl.handle.net/10356/74697
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