Analysis of memory BIST architecture flow

• 主要作者: Sharma, Anmol
• 其他作者: Chang Chip Hong
• 格式: Theses and Dissertations
• 語言: English
• 出版: 2018
• 主題: DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits
• 在線閱讀: http://hdl.handle.net/10356/76070
• 機構: Nanyang Technological University

The burgeoning amount and complexity of memories in modern SoC have brought forth new challenges in memory testing. Memory Built-in self-test (BIST) is the most widely used solution for memory testing. MBIST is defined as a method used for insertion of embedded memory controllers inside the chip to...