Analysis of memory BIST architecture flow

• Main Author: Sharma, Anmol
• Other Authors: Chang Chip Hong
• Format: Theses and Dissertations
• Language: English
• Published: 2018
• Subjects: DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits
• Online Access: http://hdl.handle.net/10356/76070
• Institution: Nanyang Technological University

The burgeoning amount and complexity of memories in modern SoC have brought forth new challenges in memory testing. Memory Built-in self-test (BIST) is the most widely used solution for memory testing. MBIST is defined as a method used for insertion of embedded memory controllers inside the chip to...