Deep convolutional neural networks for manufactured IC image analysis
Image analysis for manufactured Integrated Circuits (IC) plays an important role in IC function verification, hardware security assurance, intellectual property protection, and etc. Circuit extraction is one of the most common and reliable approaches to manufactured IC image analysis. However, the a...
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| Format: | Final Year Project |
| Language: | English |
| Published: |
2019
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| Online Access: | http://hdl.handle.net/10356/78126 |
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| Institution: | Nanyang Technological University |
| Language: | English |