Deep convolutional neural networks for manufactured IC image analysis

• Main Author: Tan, Weiwei
• Other Authors: Gwee Bah Hwee
• Format: Final Year Project
• Language: English
• Published: 2019
• Subjects: DRNTU::Engineering::Electrical and electronic engineering
• Online Access: http://hdl.handle.net/10356/78126
• Institution: Nanyang Technological University

Image analysis for manufactured Integrated Circuits (IC) plays an important role in IC function verification, hardware security assurance, intellectual property protection, and etc. Circuit extraction is one of the most common and reliable approaches to manufactured IC image analysis. However, the a...