Classification of defects in semiconductor wafer using artificial intelligence

• المؤلف الرئيسي: Lit, Yek Kit
• مؤلفون آخرون: Anand Krishna Asundi
• التنسيق: Final Year Project
• اللغة: English
• منشور في: 2019
• الموضوعات: Engineering::Mechanical engineering
• الوصول للمادة أونلاين: http://hdl.handle.net/10356/78800
• المؤسسة: Nanyang Technological University

Machine learning, a subset of artificial intelligence is an emerging technology that enabled the classification of objects without the need of being explicitly programmed. Due to the popularity of artificial intelligence, many frameworks were invented. ANN, CNN, Faster RCNN will be explained t...