Classification of defects in semiconductor wafer using artificial intelligence

• Main Author: Lit, Yek Kit
• Other Authors: Anand Krishna Asundi
• Format: Final Year Project
• Language: English
• Published: 2019
• Subjects: Engineering::Mechanical engineering
• Online Access: http://hdl.handle.net/10356/78800
• Institution: Nanyang Technological University

Machine learning, a subset of artificial intelligence is an emerging technology that enabled the classification of objects without the need of being explicitly programmed. Due to the popularity of artificial intelligence, many frameworks were invented. ANN, CNN, Faster RCNN will be explained t...