Influence of solid-state interfacial reactions on the tensile strength of Cu/electroless Ni–P/Sn–3.5Ag solder joint

Tensile strength and fracture behavior of Cu/electroless Ni–P/Sn–3.5Ag (wt.% Ag) solder joint were investigated under high-temperature solid-state aging. The aging results showed that the Ni3Sn4 intermetallic phase grows at the electroless Ni–P/Sn–3.5Ag interface, along with the transformation of th...

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Main Authors: Kumar, Aditya, Chen, Zhong
其他作者: School of Materials Science & Engineering
格式: Article
語言:English
出版: 2013
主題:
在線閱讀:https://hdl.handle.net/10356/79900
http://hdl.handle.net/10220/9382
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機構: Nanyang Technological University
語言: English