Interfacial study of electroless Ni-Sn-P plating and Sn-3.5Ag solder after multiple reflows

Electroless Ni-P plating has been a good candidate for Under Bump Metallization (UBM) in IC packaging due to its lower cost and slower chemical reaction with solder compared to Cu based UBM. However, during its reaction with Sn-based lead free solder, it faces the problem of rapid Ni out diffusion w...

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書目詳細資料
主要作者: Sumboja, Afriyanti.
其他作者: Chen Zhong
格式: Final Year Project
語言:English
出版: 2009
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在線閱讀:http://hdl.handle.net/10356/15307
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機構: Nanyang Technological University
語言: English