Testing Feasibility of Back-Side Laser Fault Injection on a Microcontroller

Laser fault attack platform constitutes a powerful tool for a precise injection of faults into the device, allowing an attacker to carefully adjust timing and position on the chip. On the other hand, the cost of such equipment is high and the profiling time is non-negligible. In this paper, we would...

Full description

Saved in:
Bibliographic Details
Main Authors: Breier, Jakub, Jap, Dirmanto
Other Authors: School of Physical and Mathematical Sciences
Format: Conference or Workshop Item
Language:English
Published: 2016
Subjects:
Online Access:https://hdl.handle.net/10356/80627
http://hdl.handle.net/10220/40619
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Nanyang Technological University
Language: English
Be the first to leave a comment!
You must be logged in first