Testing Feasibility of Back-Side Laser Fault Injection on a Microcontroller
Laser fault attack platform constitutes a powerful tool for a precise injection of faults into the device, allowing an attacker to carefully adjust timing and position on the chip. On the other hand, the cost of such equipment is high and the profiling time is non-negligible. In this paper, we would...
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Main Authors: | Breier, Jakub, Jap, Dirmanto |
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Other Authors: | School of Physical and Mathematical Sciences |
Format: | Conference or Workshop Item |
Language: | English |
Published: |
2016
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/80627 http://hdl.handle.net/10220/40619 |
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Institution: | Nanyang Technological University |
Language: | English |
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