Testing Feasibility of Back-Side Laser Fault Injection on a Microcontroller

• المؤلفون الرئيسيون: Breier, Jakub, Jap, Dirmanto
• مؤلفون آخرون: School of Physical and Mathematical Sciences
• التنسيق: Conference or Workshop Item
• اللغة: English
• منشور في: 2016
• الموضوعات: Laser; Fault Attack; ATmega328P
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/80627; http://hdl.handle.net/10220/40619
• المؤسسة: Nanyang Technological University

Laser fault attack platform constitutes a powerful tool for a precise injection of faults into the device, allowing an attacker to carefully adjust timing and position on the chip. On the other hand, the cost of such equipment is high and the profiling time is non-negligible. In this paper, we would...