Testing Feasibility of Back-Side Laser Fault Injection on a Microcontroller

Laser fault attack platform constitutes a powerful tool for a precise injection of faults into the device, allowing an attacker to carefully adjust timing and position on the chip. On the other hand, the cost of such equipment is high and the profiling time is non-negligible. In this paper, we would...

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書目詳細資料
Main Authors: Breier, Jakub, Jap, Dirmanto
其他作者: School of Physical and Mathematical Sciences
格式: Conference or Workshop Item
語言:English
出版: 2016
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在線閱讀:https://hdl.handle.net/10356/80627
http://hdl.handle.net/10220/40619
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