Closed-loop ARS mode for scanning ion conductance microscopy with improved speed and stability for live cell imaging applications

• Main Authors: Jung, Goo-Eun, Noh, Hanaul, Shin, Yong Kyun, Kahng, Se-Jong, Baik, Ku Youn, Kim, Hong-Bae, Cho, Nam-Joon, Cho, Sang-Joon
• Other Authors: School of Materials Science & Engineering
• Format: Article
• Language: English
• Published: 2016
• Subjects: Nanotechnology
• Online Access: https://hdl.handle.net/10356/81090; http://hdl.handle.net/10220/40649
• Institution: Nanyang Technological University

Scanning ion conductance microscopy (SICM) is an increasingly useful nanotechnology tool for non-contact, high resolution imaging of live biological specimens such as cellular membranes. In particular, approach-retract-scanning (ARS) mode enables fast probing of delicate biological structures by rap...