Phase Fourier Reconstruction for Anomaly Detection on Metal Surface Using Salient Irregularity

• Main Authors: Hung, Tzu-Yi, Vaikundam, Sriram, Natarajan, Vidhya, Chia, Liang-Tien
• Other Authors: School of Computer Science and Engineering
• Format: Conference or Workshop Item
• Language: English
• Published: 2017
• Subjects: Defect detection; Anomaly detection
• Online Access: https://hdl.handle.net/10356/83030; http://hdl.handle.net/10220/42366
• Institution: Nanyang Technological University

12 p.