TiN-Mediated Multi-Level Negative Photoconductance of the ZrO2 Breakdown Path

• Main Authors: Zhou, Yu, Kawashima, Tomohito, Ang, Diing Shenp
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2017
• Subjects: High-k oxide; Negative photoconductivity
• Online Access: https://hdl.handle.net/10356/84046; http://hdl.handle.net/10220/42904
• Institution: Nanyang Technological University

We present new evidence that the non-volatile negative photoconductivity (NPC) response of the ZrO2 breakdown path can be suppressed or tuned to different levels by repeated application of a positive voltage-bias on the TiN electrode prior to light exposure. A negative voltage-bias does not produce...