TiN-Mediated Multi-Level Negative Photoconductance of the ZrO2 Breakdown Path

We present new evidence that the non-volatile negative photoconductivity (NPC) response of the ZrO2 breakdown path can be suppressed or tuned to different levels by repeated application of a positive voltage-bias on the TiN electrode prior to light exposure. A negative voltage-bias does not produce...

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Bibliographic Details
Main Authors: Zhou, Yu, Kawashima, Tomohito, Ang, Diing Shenp
Other Authors: School of Electrical and Electronic Engineering
Format: Article
Language:English
Published: 2017
Subjects:
Online Access:https://hdl.handle.net/10356/84046
http://hdl.handle.net/10220/42904
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Institution: Nanyang Technological University
Language: English

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