Measurement of the minority carrier lifetime of PbxSn1-xTe thin films using the method of photoconductive decay
The minority carrier lifetime of PbxSn1-x Te thin films were determined using the photoconductive decay set-up. The fabricated thin film samples had a concentration of X = 0.2, 0.5, and 0.8. Each sample was illuminated by a stroboscope with a frequency of 3000 revolutions per minute from which the p...
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| Main Authors: | , |
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| Format: | text |
| Language: | English |
| Published: |
Animo Repository
1996
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| Subjects: | |
| Online Access: | https://animorepository.dlsu.edu.ph/etd_bachelors/4157 |
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| Institution: | De La Salle University |
| Language: | English |