Measurement of the minority carrier lifetime of PbxSn1-xTe thin films using the method of photoconductive decay

• المؤلفون الرئيسيون: Cua, Alvin T., Lau, John Michael A.
• التنسيق: text
• اللغة: English
• منشور في: Animo Repository 1996
• الموضوعات: Thin films; Photoconductivity; Physics
• الوصول للمادة أونلاين: https://animorepository.dlsu.edu.ph/etd_bachelors/4157

The minority carrier lifetime of PbxSn1-x Te thin films were determined using the photoconductive decay set-up. The fabricated thin film samples had a concentration of X = 0.2, 0.5, and 0.8. Each sample was illuminated by a stroboscope with a frequency of 3000 revolutions per minute from which the p...