The study of the charge collection of the normal-collector configuration

• المؤلفون الرئيسيون: Tan, Chee Chin., Ong, Vincent K. S., Radhakrishnan, K.
• مؤلفون آخرون: School of Electrical and Electronic Engineering
• التنسيق: مقال
• اللغة: English
• منشور في: 2013
• الموضوعات: DRNTU::Engineering::Electrical and electronic engineering
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/85076; http://hdl.handle.net/10220/10555

Charge collection is one of the crucial processes to collect the induced current when a semiconductor sample is subjected to some external excitations such as the electron or photon beams. The charge collection probability is the basis in the study of this induced current particularly in the field o...