The study of the charge collection of the normal-collector configuration

• Main Authors: Tan, Chee Chin., Ong, Vincent K. S., Radhakrishnan, K.
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2013
• Subjects: DRNTU::Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/85076; http://hdl.handle.net/10220/10555
• Institution: Nanyang Technological University

Charge collection is one of the crucial processes to collect the induced current when a semiconductor sample is subjected to some external excitations such as the electron or photon beams. The charge collection probability is the basis in the study of this induced current particularly in the field o...