Ripple rotation on ion sputtered Si (100)

Controllable process of ion sputtered rippling is of significance for the generation of nanostructures on technologically important Si surface. Si(100) was irradiated with 30 kV focused Ga+ ions at various incidence angles. It was found that ripple only formed at 30° incidence angle. At low ion dose...

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Bibliographic Details
Main Authors: Qian, H. X., Zhou, W.
Other Authors: School of Mechanical and Aerospace Engineering
Format: Article
Language:English
Published: 2013
Online Access:https://hdl.handle.net/10356/85520
http://hdl.handle.net/10220/17279
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Institution: Nanyang Technological University
Language: English
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