A new phase error compensation method in digital holographic microscopy
In this paper we present a new method to compensate for phase aberrations and image distortion with recording single digital hologram in digital holographic microscopy. In our method, tilt is removed from the abberrated phase map first. Then an area of interest (AOI) is generated by flood filled alg...
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| Main Authors: | , , , , |
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| Other Authors: | |
| Format: | Conference or Workshop Item |
| Language: | English |
| Published: |
2018
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| Subjects: | |
| Online Access: | https://hdl.handle.net/10356/88183 http://hdl.handle.net/10220/46905 |
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| Institution: | Nanyang Technological University |
| Language: | English |
| Summary: | In this paper we present a new method to compensate for phase aberrations and image distortion with recording single digital hologram in digital holographic microscopy. In our method, tilt is removed from the abberrated phase map first. Then an area of interest (AOI) is generated by flood filled algorithm. By fitting AOI with discrete orthogonal Zernike polynomials, error phase map in the form of a series of Zernike polynomials is obtained. Final result can be calculated by subtracting the error phase map from the abberrated phase map. Through applying our method in microlens testing, phase aberrations and image distortion introduced by microscope objective are well suppressed. |
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