A new phase error compensation method in digital holographic microscopy

In this paper we present a new method to compensate for phase aberrations and image distortion with recording single digital hologram in digital holographic microscopy. In our method, tilt is removed from the abberrated phase map first. Then an area of interest (AOI) is generated by flood filled alg...

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Main Authors: Wang, Zhaomin, Qu, Weijuan, Wen, Yongfu, Yang, Fang, Asundi, Anand
Other Authors: Quan, Chenggen
Format: Conference or Workshop Item
Language:English
Published: 2018
Subjects:
Online Access:https://hdl.handle.net/10356/88183
http://hdl.handle.net/10220/46905
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-881832023-03-04T17:08:02Z A new phase error compensation method in digital holographic microscopy Wang, Zhaomin Qu, Weijuan Wen, Yongfu Yang, Fang Asundi, Anand Quan, Chenggen Qian, Kemao Asundi, Anand Chau, Fook Siong School of Mechanical and Aerospace Engineering Proceedings of SPIE - International Conference on Experimental Mechanics 2014 Digital Holography DRNTU::Engineering::Mechanical engineering Zernike Polynomials In this paper we present a new method to compensate for phase aberrations and image distortion with recording single digital hologram in digital holographic microscopy. In our method, tilt is removed from the abberrated phase map first. Then an area of interest (AOI) is generated by flood filled algorithm. By fitting AOI with discrete orthogonal Zernike polynomials, error phase map in the form of a series of Zernike polynomials is obtained. Final result can be calculated by subtracting the error phase map from the abberrated phase map. Through applying our method in microlens testing, phase aberrations and image distortion introduced by microscope objective are well suppressed. NRF (Natl Research Foundation, S’pore) MOE (Min. of Education, S’pore) Published version 2018-12-11T06:11:52Z 2019-12-06T16:57:54Z 2018-12-11T06:11:52Z 2019-12-06T16:57:54Z 2015 Conference Paper Wang, Z., Qu, W., Wen, Y., Yang, F., & Asundi, A. (2015). A new phase error compensation method in digital holographic microscopy. Proceedings of SPIE - International Conference on Experimental Mechanics 2014, 9302, 93023M-. doi:10.1117/12.2076855 https://hdl.handle.net/10356/88183 http://hdl.handle.net/10220/46905 10.1117/12.2076855 en © 2015 Society of Photo-optical Instrumentation Engineers (SPIE). This paper was published in Proceedings of SPIE - International Conference on Experimental Mechanics 2014 and is made available as an electronic reprint (preprint) with permission of Society of Photo-optical Instrumentation Engineers (SPIE). The published version is available at: [http://dx.doi.org/10.1117/12.2076855]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law. 8 p. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic Digital Holography
DRNTU::Engineering::Mechanical engineering
Zernike Polynomials
spellingShingle Digital Holography
DRNTU::Engineering::Mechanical engineering
Zernike Polynomials
Wang, Zhaomin
Qu, Weijuan
Wen, Yongfu
Yang, Fang
Asundi, Anand
A new phase error compensation method in digital holographic microscopy
description In this paper we present a new method to compensate for phase aberrations and image distortion with recording single digital hologram in digital holographic microscopy. In our method, tilt is removed from the abberrated phase map first. Then an area of interest (AOI) is generated by flood filled algorithm. By fitting AOI with discrete orthogonal Zernike polynomials, error phase map in the form of a series of Zernike polynomials is obtained. Final result can be calculated by subtracting the error phase map from the abberrated phase map. Through applying our method in microlens testing, phase aberrations and image distortion introduced by microscope objective are well suppressed.
author2 Quan, Chenggen
author_facet Quan, Chenggen
Wang, Zhaomin
Qu, Weijuan
Wen, Yongfu
Yang, Fang
Asundi, Anand
format Conference or Workshop Item
author Wang, Zhaomin
Qu, Weijuan
Wen, Yongfu
Yang, Fang
Asundi, Anand
author_sort Wang, Zhaomin
title A new phase error compensation method in digital holographic microscopy
title_short A new phase error compensation method in digital holographic microscopy
title_full A new phase error compensation method in digital holographic microscopy
title_fullStr A new phase error compensation method in digital holographic microscopy
title_full_unstemmed A new phase error compensation method in digital holographic microscopy
title_sort new phase error compensation method in digital holographic microscopy
publishDate 2018
url https://hdl.handle.net/10356/88183
http://hdl.handle.net/10220/46905
_version_ 1759857316749901824