Capability enhancement in compact digital holographic microscopy

A compact reflection digital holographic microscopy (DHM) system integrated with the light source and optical interferometer is developed for 3D topographic characterization and real-time dynamic inspection for Microelectromechanical systems (MEMS). Capability enhancement methods in lateral resoluti...

全面介紹

Saved in:
書目詳細資料
Main Authors: Qu, Weijuan, Wen, Yongfu, Wang, Zhaomin, Yang, Fang, Asundi, Anand
其他作者: Quan, Chenggen
格式: Conference or Workshop Item
語言:English
出版: 2018
主題:
在線閱讀:https://hdl.handle.net/10356/88315
http://hdl.handle.net/10220/46913
標簽: 添加標簽
沒有標簽, 成為第一個標記此記錄!