Influence of silicon-nanocrystal distribution in SiO2 matrix on charge injection and charge decay

• Main Authors: Tseng, Ampere A., Ng, Chi Yung, Chen, Tupei, Tse, Man Siu, Fung, Stevenson Hon Yuen, Lim, Vanissa Sei Wei
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2010
• Subjects: DRNTU::Engineering::Electrical and electronic engineering::Nanoelectronics
• Online Access: https://hdl.handle.net/10356/90604; http://hdl.handle.net/10220/6355
• Institution: Nanyang Technological University

Influence of distribution of silicon nanocrystals (nc-Si) embedded in SiO2 matrix on charge injection and charge decay of the nc-Si has been investigated with electrostatic force microscopy. For nc-Si distributing in the surface region, the size of charge cloud does not change with decay time, and n...