A CMOS ISFET interface circuit with dynamic current temperature compensation technique

• Main Authors: Chan, Pak Kwong, Chen, D. Y.
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2009
• Subjects: DRNTU::Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/91301; http://hdl.handle.net/10220/4660
• Institution: Nanyang Technological University

This paper presents a new ion-sensitive field-effect transistor (ISFET ) readout circuit including a novel nonlinear temperature compensation method that is based on the theoretical work for formulating a body-effect-based ISFET drain current expression, the derivation of an unified temperature-depe...