Optical properties of silicon nanocrystals embedded in a SiO2 matrix

Optical properties of isolated silicon nanocrystals (nc-Si) with a mean size of ∼4 nm embedded in a SiO2 matrix that was synthesized with an ion beam technique have been determined with spectroscopic ellipsometry in the photon energy range of 1.1–5.0 eV. The optical properties of the nc-Si are foun...

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Main Authors: Ding, Liang, Chen, Tupei, Liu, Yang, Ng, Chi Yung, Fung, Stevenson Hon Yuen
其他作者: School of Electrical and Electronic Engineering
格式: Article
語言:English
出版: 2010
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在線閱讀:https://hdl.handle.net/10356/91319
http://hdl.handle.net/10220/6358
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