Phase extraction from electronic speckle patterns by statistical analysis
In electronic speckle pattern interferometry (ESPI), speckles are information carriers as well as noise that hinders the extraction of high quality phase. This paper presents a phase extraction method based on the statistical property of speckles. Assuming that speckle related phase is a random vari...
Saved in:
| Main Authors: | , , , |
|---|---|
| 其他作者: | |
| 格式: | Article |
| 語言: | English |
| 出版: |
2011
|
| 主題: | |
| 在線閱讀: | https://hdl.handle.net/10356/91582 http://hdl.handle.net/10220/6705 |
| 標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|