Overwrite in thin film disk recording systems

• Main Authors: Lin, Herbert Gang, Zhao, Yang, Bertram, H. Neal
• Other Authors: School of Materials Science & Engineering
• Format: Article
• Language: English
• Published: 2011
• Subjects: DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films
• Online Access: https://hdl.handle.net/10356/91938; http://hdl.handle.net/10220/6726
• Institution: Nanyang Technological University

Overwrite in thin film rigid disk recording has been studied experimentally using disks with a wide range of magnetic moment and coercivity. Standard f2/f1 overwrite was investigated in detail at various recording currents and different flying heights. A theoretical model was developed using simple analytical approximations that relate demagnetization-field-induced position shift (hard transition shift) to the measured overwrite. The demagnetization fields due to the leading edge transitions were calculated analytically including a good approximation to the gapped head image. The results compare well with experimental measurements. A new overwrite measurement technique using the second harmonic component of a 0.5f1 signal is also described in this work.