Overwrite in thin film disk recording systems

Overwrite in thin film rigid disk recording has been studied experimentally using disks with a wide range of magnetic moment and coercivity. Standard f2/f1 overwrite was investigated in detail at various recording currents and different flying heights. A theoretical model was developed using simple...

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Main Authors: Lin, Herbert Gang, Zhao, Yang, Bertram, H. Neal
Other Authors: School of Materials Science & Engineering
Format: Article
Language:English
Published: 2011
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Online Access:https://hdl.handle.net/10356/91938
http://hdl.handle.net/10220/6726
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-919382023-07-14T15:52:26Z Overwrite in thin film disk recording systems Lin, Herbert Gang Zhao, Yang Bertram, H. Neal School of Materials Science & Engineering DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films Overwrite in thin film rigid disk recording has been studied experimentally using disks with a wide range of magnetic moment and coercivity. Standard f2/f1 overwrite was investigated in detail at various recording currents and different flying heights. A theoretical model was developed using simple analytical approximations that relate demagnetization-field-induced position shift (hard transition shift) to the measured overwrite. The demagnetization fields due to the leading edge transitions were calculated analytically including a good approximation to the gapped head image. The results compare well with experimental measurements. A new overwrite measurement technique using the second harmonic component of a 0.5f1 signal is also described in this work. Published version 2011-03-03T01:43:11Z 2019-12-06T18:14:30Z 2011-03-03T01:43:11Z 2019-12-06T18:14:30Z 1993 1993 Journal Article Lin, H. G., Zhao, Y., & Bertram, H. N. (1993). Overwrite in Thin Film Disk Recording Systems. IEEE transactions on magnetics, 29(6), 4215-4223. https://hdl.handle.net/10356/91938 http://hdl.handle.net/10220/6726 10.1109/20.280861 en IEEE transactions on magnetics © 1993 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. http://www.ieee.org/portal/site. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. 9 p. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films
spellingShingle DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films
Lin, Herbert Gang
Zhao, Yang
Bertram, H. Neal
Overwrite in thin film disk recording systems
description Overwrite in thin film rigid disk recording has been studied experimentally using disks with a wide range of magnetic moment and coercivity. Standard f2/f1 overwrite was investigated in detail at various recording currents and different flying heights. A theoretical model was developed using simple analytical approximations that relate demagnetization-field-induced position shift (hard transition shift) to the measured overwrite. The demagnetization fields due to the leading edge transitions were calculated analytically including a good approximation to the gapped head image. The results compare well with experimental measurements. A new overwrite measurement technique using the second harmonic component of a 0.5f1 signal is also described in this work.
author2 School of Materials Science & Engineering
author_facet School of Materials Science & Engineering
Lin, Herbert Gang
Zhao, Yang
Bertram, H. Neal
format Article
author Lin, Herbert Gang
Zhao, Yang
Bertram, H. Neal
author_sort Lin, Herbert Gang
title Overwrite in thin film disk recording systems
title_short Overwrite in thin film disk recording systems
title_full Overwrite in thin film disk recording systems
title_fullStr Overwrite in thin film disk recording systems
title_full_unstemmed Overwrite in thin film disk recording systems
title_sort overwrite in thin film disk recording systems
publishDate 2011
url https://hdl.handle.net/10356/91938
http://hdl.handle.net/10220/6726
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