A 4.06 mW 10-bit 150 MS/s SAR ADC with 1.5-bit/cycle operation for medical imaging applications

This paper reports a 10-bit 150 MS/s successive approximation register analog-to-digital converter with binary-scaled redundancy-facilitated error correction technique. The proposed 1.5-bit/cycle technique with built-in capacitive digital-to-analog converter (CDAC) redundancy, corrects multiple erro...

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Bibliographic Details
Main Authors: Sunny, Sharma, Chen, Yong, Boon, Chirn Chye
Other Authors: School of Electrical and Electronic Engineering
Format: Article
Language:English
Published: 2019
Subjects:
ADC
Online Access:https://hdl.handle.net/10356/92451
http://hdl.handle.net/10220/49924
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Institution: Nanyang Technological University
Language: English
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Summary:This paper reports a 10-bit 150 MS/s successive approximation register analog-to-digital converter with binary-scaled redundancy-facilitated error correction technique. The proposed 1.5-bit/cycle technique with built-in capacitive digital-to-analog converter (CDAC) redundancy, corrects multiple erroneous decisions in a total of nine conversion cycles. The proposed binary-scaled redundancy provides a 12.5% error tolerance range for the incomplete CDAC voltage settling. The digital error-correction logic circuit presented uses a bit-overlap-and-add technique. The prototype chip was fabricated in 65-nm CMOS technology and occupies chip area of 0.038 mm 2 . It consumes 4.06 mW from a 1.2 V supply, achieving the Nyquist signal-to-noise-and-distortion ratio of 57.81 dB and the effective number of bits of 9.31-bit at an operating frequency of 150 MS/s, corresponding to the figure-of-merit of 42.6 fJ/ conversion-step.