Electronic mechanism of critical temperature variation in RBa2Cu3O7−δ

We have performed systematic studies of the trend of the critical temperature Tc due to both Madelung site potential difference between in-plane oxygen and copper sites ΔVM and interlayer effect in the optimally doped 123 superconductors RBa2Cu3O7−δ. ΔVM is found to decrease with the i...

Full description

Saved in:
Bibliographic Details
Main Authors: Chen, Xiao Jia, Su, Haibin
Other Authors: School of Materials Science & Engineering
Format: Article
Language:English
Published: 2011
Subjects:
Online Access:https://hdl.handle.net/10356/93915
http://hdl.handle.net/10220/6929
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Nanyang Technological University
Language: English
id sg-ntu-dr.10356-93915
record_format dspace
spelling sg-ntu-dr.10356-939152023-07-14T15:52:33Z Electronic mechanism of critical temperature variation in RBa2Cu3O7−δ Chen, Xiao Jia Su, Haibin School of Materials Science & Engineering DRNTU::Engineering::Materials::Magnetic materials We have performed systematic studies of the trend of the critical temperature Tc due to both Madelung site potential difference between in-plane oxygen and copper sites ΔVM and interlayer effect in the optimally doped 123 superconductors RBa2Cu3O7−δ. ΔVM is found to decrease with the increase of the trivalent rare-earth ionic radius rR3+. This change enhances the next-nearest-neighbor hopping integral t', which results in the experimentally observed increase of Tc with rR3+. The coherent interlayer single-particle hopping t⊥ has a more profound effect than t' on the nearly linear trend of Tc as a function of rR3+. These results reveal the importance of the electronic origin of the rare-earth ionic size effect on Tc in this family. Published version 2011-07-19T06:58:43Z 2019-12-06T18:47:40Z 2011-07-19T06:58:43Z 2019-12-06T18:47:40Z 2005 2005 Journal Article Chen, X. J., & Su, H. (2005). Electronic mechanism of critical temperature variation in RBa2Cu3O7−δ. Physical Review B, 71. https://hdl.handle.net/10356/93915 http://hdl.handle.net/10220/6929 10.1103/PhysRevB.71.094512 en Physical review B © 2005 American Physical Society. This paper was published in Physical Review B and is made available as an electronic reprint (preprint) with permission of American Physical Society. The paper can be found at: [DOI: http://dx.doi.org/10.1103/PhysRevB.71.094512]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law. 6 p. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic DRNTU::Engineering::Materials::Magnetic materials
spellingShingle DRNTU::Engineering::Materials::Magnetic materials
Chen, Xiao Jia
Su, Haibin
Electronic mechanism of critical temperature variation in RBa2Cu3O7−δ
description We have performed systematic studies of the trend of the critical temperature Tc due to both Madelung site potential difference between in-plane oxygen and copper sites ΔVM and interlayer effect in the optimally doped 123 superconductors RBa2Cu3O7−δ. ΔVM is found to decrease with the increase of the trivalent rare-earth ionic radius rR3+. This change enhances the next-nearest-neighbor hopping integral t', which results in the experimentally observed increase of Tc with rR3+. The coherent interlayer single-particle hopping t⊥ has a more profound effect than t' on the nearly linear trend of Tc as a function of rR3+. These results reveal the importance of the electronic origin of the rare-earth ionic size effect on Tc in this family.
author2 School of Materials Science & Engineering
author_facet School of Materials Science & Engineering
Chen, Xiao Jia
Su, Haibin
format Article
author Chen, Xiao Jia
Su, Haibin
author_sort Chen, Xiao Jia
title Electronic mechanism of critical temperature variation in RBa2Cu3O7−δ
title_short Electronic mechanism of critical temperature variation in RBa2Cu3O7−δ
title_full Electronic mechanism of critical temperature variation in RBa2Cu3O7−δ
title_fullStr Electronic mechanism of critical temperature variation in RBa2Cu3O7−δ
title_full_unstemmed Electronic mechanism of critical temperature variation in RBa2Cu3O7−δ
title_sort electronic mechanism of critical temperature variation in rba2cu3o7−δ
publishDate 2011
url https://hdl.handle.net/10356/93915
http://hdl.handle.net/10220/6929
_version_ 1772827688366505984