Thickness dependency of field emission in amorphous and nanostructured carbon thin films

• Main Authors: Shakerzadeh, Maziar, Teo, Edwin Hang Tong, Tay, Beng Kang
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2013
• Subjects: DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films
• Online Access: https://hdl.handle.net/10356/94809; http://hdl.handle.net/10220/9318
• Institution: Nanyang Technological University

Thickness dependency of the field emission of amorphous and nanostructured carbon thin films has been studied. It is found that in amorphous and carbon films with nanometer-sized sp2 clusters, the emission does not depend on the film thickness. This further proves that the emission happens from the...