Ferroelastic strain induced antiferroelectric-ferroelectric phase transformation in multilayer thin film structures
Coupling effects among mechanical, electrical and magnetic parameters in thin film structures including ferroic thin films provide exciting opportunity for creating device functionalities. For thin films deposited on a substrate, their mechanical stress and microstructure are usually determined by t...
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Main Authors: | , , |
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Other Authors: | |
Format: | Article |
Language: | English |
Published: |
2013
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Online Access: | https://hdl.handle.net/10356/95067 http://hdl.handle.net/10220/9398 |
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Institution: | Nanyang Technological University |
Language: | English |