Ferroelastic strain induced antiferroelectric-ferroelectric phase transformation in multilayer thin film structures

Coupling effects among mechanical, electrical and magnetic parameters in thin film structures including ferroic thin films provide exciting opportunity for creating device functionalities. For thin films deposited on a substrate, their mechanical stress and microstructure are usually determined by t...

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Bibliographic Details
Main Authors: Mirshekarloo, Meysam Sharifzadeh, Yao, Kui, Sritharan, Thirumany
Other Authors: School of Materials Science & Engineering
Format: Article
Language:English
Published: 2013
Online Access:https://hdl.handle.net/10356/95067
http://hdl.handle.net/10220/9398
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Institution: Nanyang Technological University
Language: English

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