Investigation of multilayer thin films using ellipsometry

• Main Author: Tikkiwal Vinay Anand.
• Other Authors: Rusli
• Format: Theses and Dissertations
• Language: English
• Published: 2013
• Subjects: DRNTU::Engineering::Electrical and electronic engineering
• Online Access: http://hdl.handle.net/10356/53469
• Institution: Nanyang Technological University

Light emission from silicon-based materials is a very important research area for optoelectronic and display applications. It is important to derive a practical light source from silicon in order to have complete photonic integrated circuits on silicon. An efficient silicon based light emitting devi...