Investigation of multilayer thin films using ellipsometry

Light emission from silicon-based materials is a very important research area for optoelectronic and display applications. It is important to derive a practical light source from silicon in order to have complete photonic integrated circuits on silicon. An efficient silicon based light emitting devi...

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Bibliographic Details
Main Author: Tikkiwal Vinay Anand.
Other Authors: Rusli
Format: Theses and Dissertations
Language:English
Published: 2013
Subjects:
Online Access:http://hdl.handle.net/10356/53469
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Institution: Nanyang Technological University
Language: English
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