Phase shift reflectometry for sub-surface defect detection

Phase Shift Reflectometry has recently been seen as a novel alternative to interferometry since it can provide warpage measurement over large areas with no need for large optical components. To confirm its capability and to explore the use of this method for sub-surface defect detection, a Chinese m...

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Main Authors: Asundi, Anand Krishna, Lei, Huang, Teoh, Eden Kang Min, Sreemathy, Parthasarathy, May, Watt Sook
Other Authors: School of Mechanical and Aerospace Engineering
Format: Conference or Workshop Item
Language:English
Published: 2013
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Online Access:https://hdl.handle.net/10356/96013
http://hdl.handle.net/10220/10061
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-960132023-03-04T17:07:50Z Phase shift reflectometry for sub-surface defect detection Asundi, Anand Krishna Lei, Huang Teoh, Eden Kang Min Sreemathy, Parthasarathy May, Watt Sook School of Mechanical and Aerospace Engineering Optical Metrology and Inspection for Industrial Applications (2nd : 2012 : Beijing, China) DRNTU::Engineering::Electrical and electronic engineering::Optics, optoelectronics, photonics Phase Shift Reflectometry has recently been seen as a novel alternative to interferometry since it can provide warpage measurement over large areas with no need for large optical components. To confirm its capability and to explore the use of this method for sub-surface defect detection, a Chinese magic mirror is used. This bronze mirror which dates back to the Chinese Han Dynasty appears at first sight to be an ordinary convex mirror. However, unlike a normal mirror, when illuminated by a beam of light, an image is formed onto a screen. It has been hypothesized that there are indentations inside the mirror which alter the path of reflected light rays and hence the reflected image. This paper explores various methods to measure these indentations. Of the methods test Phase Shift Reflectometry (PSR) was found suitable to be the most suitable both in terms of the sensitivity and the field of view. Published version 2013-06-05T04:08:44Z 2019-12-06T19:24:29Z 2013-06-05T04:08:44Z 2019-12-06T19:24:29Z 2012 2012 Conference Paper Asundi, A., Lei, H., Teoh, E. K. M., Sreemathy, P., & May, W. S. (2012). Phase shift reflectometry for sub-surface defect detection. Proceedings of SPIE - Optical Metrology and Inspection for Industrial Applications II, 85630G. https://hdl.handle.net/10356/96013 http://hdl.handle.net/10220/10061 10.1117/12.1000032 en © 2012 Society of Photo-Optical Instrumentation Engineers (SPIE). This paper was published in Proceedings of SPIE - Optical Metrology and Inspection for Industrial Applications II and is made available as an electronic reprint (preprint) with permission of Society of Photo-Optical Instrumentation Engineers (SPIE). The paper can be found at the following official DOI: [http://dx.doi.org/10.1117/12.1000032].  One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic DRNTU::Engineering::Electrical and electronic engineering::Optics, optoelectronics, photonics
spellingShingle DRNTU::Engineering::Electrical and electronic engineering::Optics, optoelectronics, photonics
Asundi, Anand Krishna
Lei, Huang
Teoh, Eden Kang Min
Sreemathy, Parthasarathy
May, Watt Sook
Phase shift reflectometry for sub-surface defect detection
description Phase Shift Reflectometry has recently been seen as a novel alternative to interferometry since it can provide warpage measurement over large areas with no need for large optical components. To confirm its capability and to explore the use of this method for sub-surface defect detection, a Chinese magic mirror is used. This bronze mirror which dates back to the Chinese Han Dynasty appears at first sight to be an ordinary convex mirror. However, unlike a normal mirror, when illuminated by a beam of light, an image is formed onto a screen. It has been hypothesized that there are indentations inside the mirror which alter the path of reflected light rays and hence the reflected image. This paper explores various methods to measure these indentations. Of the methods test Phase Shift Reflectometry (PSR) was found suitable to be the most suitable both in terms of the sensitivity and the field of view.
author2 School of Mechanical and Aerospace Engineering
author_facet School of Mechanical and Aerospace Engineering
Asundi, Anand Krishna
Lei, Huang
Teoh, Eden Kang Min
Sreemathy, Parthasarathy
May, Watt Sook
format Conference or Workshop Item
author Asundi, Anand Krishna
Lei, Huang
Teoh, Eden Kang Min
Sreemathy, Parthasarathy
May, Watt Sook
author_sort Asundi, Anand Krishna
title Phase shift reflectometry for sub-surface defect detection
title_short Phase shift reflectometry for sub-surface defect detection
title_full Phase shift reflectometry for sub-surface defect detection
title_fullStr Phase shift reflectometry for sub-surface defect detection
title_full_unstemmed Phase shift reflectometry for sub-surface defect detection
title_sort phase shift reflectometry for sub-surface defect detection
publishDate 2013
url https://hdl.handle.net/10356/96013
http://hdl.handle.net/10220/10061
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