Impact of charge-coupled device size on axial measurement error in digital holographic system

• Main Authors: Hao, Yan, Asundi, Anand Krishna
• Other Authors: School of Mechanical and Aerospace Engineering
• Format: Article
• Language: English
• Published: 2013
• Subjects: DRNTU::Engineering::Mechanical engineering
• Online Access: https://hdl.handle.net/10356/96318; http://hdl.handle.net/10220/11897
• Institution: Nanyang Technological University

Digital holography (DH) is a 3D measurement technique with a theoretical axial resolution of better than 1-2 nm. However, practically, the axial resolution has been quoted to be in the range 10-20 nm. One possible reason is that the axial measurement error is much larger so that the theoretical axia...