Impact of charge-coupled device size on axial measurement error in digital holographic system
Digital holography (DH) is a 3D measurement technique with a theoretical axial resolution of better than 1-2 nm. However, practically, the axial resolution has been quoted to be in the range 10-20 nm. One possible reason is that the axial measurement error is much larger so that the theoretical axia...
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| Main Authors: | , |
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| Other Authors: | |
| Format: | Article |
| Language: | English |
| Published: |
2013
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| Subjects: | |
| Online Access: | https://hdl.handle.net/10356/96318 http://hdl.handle.net/10220/11897 |
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| Institution: | Nanyang Technological University |
| Language: | English |