High Johnson’s figure of merit (8.32 THz·V) in 0.15-µm conventional T-gate AlGaN/GaN HEMTs on silicon
AlGaN/GaN high-electron-mobility transistors (HEMTs) with a 0.15-µm gate were fabricated on a Si substrate with an 8-nm-thick AlGaN barrier. The device exhibited a unity current gain cutoff frequency fT of 63 GHz and maximum oscillation frequency fmax of 124 GHz. Its three-terminal OFF-state breakdo...
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sg-ntu-dr.10356-983342020-03-07T12:47:16Z High Johnson’s figure of merit (8.32 THz·V) in 0.15-µm conventional T-gate AlGaN/GaN HEMTs on silicon Ranjan, Kumud Arulkumaran, Subramaniam Ng, Geok Ing Vicknesh, Sahmuganathan School of Electrical and Electronic Engineering Temasek Laboratories DRNTU::Engineering::Electrical and electronic engineering::Semiconductors AlGaN/GaN high-electron-mobility transistors (HEMTs) with a 0.15-µm gate were fabricated on a Si substrate with an 8-nm-thick AlGaN barrier. The device exhibited a unity current gain cutoff frequency fT of 63 GHz and maximum oscillation frequency fmax of 124 GHz. Its three-terminal OFF-state breakdown voltage BVgd is as high as 132 V. The estimated Johnson's figure of merit (=BVgd × fT) is 8.32 × 1012 V/s (8.32 THz·V), which is the highest value ever reported for a conventional SiN-passivated T-gate AlGaN/GaN HEMTs on a Si substrate without an additional field plate or gamma gate. 2015-05-25T03:19:37Z 2019-12-06T19:53:39Z 2015-05-25T03:19:37Z 2019-12-06T19:53:39Z 2014 2014 Journal Article Ranjan, K., Arulkumaran, S., Ng, G. I., & Vicknesh, S. (2014). High Johnson’s figure of merit (8.32 THz·V) in 0.15-µm conventional T-gate AlGaN/GaN HEMTs on silicon. Applied physics express, 7(4), 044102-. https://hdl.handle.net/10356/98334 http://hdl.handle.net/10220/25662 10.7567/APEX.7.044102 en Applied physics express © 2014 The Japan Society of Applied Physics. |
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DRNTU::Engineering::Electrical and electronic engineering::Semiconductors Ranjan, Kumud Arulkumaran, Subramaniam Ng, Geok Ing Vicknesh, Sahmuganathan High Johnson’s figure of merit (8.32 THz·V) in 0.15-µm conventional T-gate AlGaN/GaN HEMTs on silicon |
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AlGaN/GaN high-electron-mobility transistors (HEMTs) with a 0.15-µm gate were fabricated on a Si substrate with an 8-nm-thick AlGaN barrier. The device exhibited a unity current gain cutoff frequency fT of 63 GHz and maximum oscillation frequency fmax of 124 GHz. Its three-terminal OFF-state breakdown voltage BVgd is as high as 132 V. The estimated Johnson's figure of merit (=BVgd × fT) is 8.32 × 1012 V/s (8.32 THz·V), which is the highest value ever reported for a conventional SiN-passivated T-gate AlGaN/GaN HEMTs on a Si substrate without an additional field plate or gamma gate. |
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School of Electrical and Electronic Engineering |
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School of Electrical and Electronic Engineering Ranjan, Kumud Arulkumaran, Subramaniam Ng, Geok Ing Vicknesh, Sahmuganathan |
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Ranjan, Kumud Arulkumaran, Subramaniam Ng, Geok Ing Vicknesh, Sahmuganathan |
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Ranjan, Kumud |
title |
High Johnson’s figure of merit (8.32 THz·V) in 0.15-µm conventional T-gate AlGaN/GaN HEMTs on silicon |
title_short |
High Johnson’s figure of merit (8.32 THz·V) in 0.15-µm conventional T-gate AlGaN/GaN HEMTs on silicon |
title_full |
High Johnson’s figure of merit (8.32 THz·V) in 0.15-µm conventional T-gate AlGaN/GaN HEMTs on silicon |
title_fullStr |
High Johnson’s figure of merit (8.32 THz·V) in 0.15-µm conventional T-gate AlGaN/GaN HEMTs on silicon |
title_full_unstemmed |
High Johnson’s figure of merit (8.32 THz·V) in 0.15-µm conventional T-gate AlGaN/GaN HEMTs on silicon |
title_sort |
high johnson’s figure of merit (8.32 thz·v) in 0.15-µm conventional t-gate algan/gan hemts on silicon |
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2015 |
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https://hdl.handle.net/10356/98334 http://hdl.handle.net/10220/25662 |
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