N-channel InGaAs field-effect transistors formed on germanium-on-insulator substrates
InGaAs n-channel metal oxide semiconductor field-effect transistors (MOSFETs) were fabricated on germanium-on-insulator (GeOI) substrate for the first time. Integration of InGaAs on a GeOI substrate was achieved using a molecular beam epitaxy (MBE)-grown InAlAs graded buffer. The fabricated MOSFET,...
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sg-ntu-dr.10356-988352020-03-07T14:02:46Z N-channel InGaAs field-effect transistors formed on germanium-on-insulator substrates Ivana Subramanian, Sujith Owen, Man Hon Samuel Tan, Kian Hua Loke, Wan Khai Wicaksono, Satrio Yoon, Soon Fatt Yeo, Yee-Chia School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering InGaAs n-channel metal oxide semiconductor field-effect transistors (MOSFETs) were fabricated on germanium-on-insulator (GeOI) substrate for the first time. Integration of InGaAs on a GeOI substrate was achieved using a molecular beam epitaxy (MBE)-grown InAlAs graded buffer. The fabricated MOSFET, with a self-aligned Ni–InGaAs metallic source/drain, achieves good device characteristics. The normalized transconductance (Gm·tox) compares very well with reported data for InGaAs n-MOSFETs formed on bulk InP substrates, and is significantly higher than reported data for In0.53Ga0.47As n-MOSFETs fabricated on Si substrates using a similar growth technique. 2013-07-31T03:05:34Z 2019-12-06T20:00:07Z 2013-07-31T03:05:34Z 2019-12-06T20:00:07Z 2012 2012 Journal Article Ivana, Subramanian, S., Owen, M. H. S., Tan, K. H., Loke, W. K., Wicaksono, S., Yoon, S. F., & Yeo, Y. C. (2012). N-Channel InGaAs Field-Effect Transistors formed on Germanium-on-Insulator Substrates. Applied Physics Express, 5(11). https://hdl.handle.net/10356/98835 http://hdl.handle.net/10220/12545 10.1143/APEX.5.116502 en Applied physics express |
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DRNTU::Engineering::Electrical and electronic engineering Ivana Subramanian, Sujith Owen, Man Hon Samuel Tan, Kian Hua Loke, Wan Khai Wicaksono, Satrio Yoon, Soon Fatt Yeo, Yee-Chia N-channel InGaAs field-effect transistors formed on germanium-on-insulator substrates |
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InGaAs n-channel metal oxide semiconductor field-effect transistors (MOSFETs) were fabricated on germanium-on-insulator (GeOI) substrate for the first time. Integration of InGaAs on a GeOI substrate was achieved using a molecular beam epitaxy (MBE)-grown InAlAs graded buffer. The fabricated MOSFET, with a self-aligned Ni–InGaAs metallic source/drain, achieves good device characteristics. The normalized transconductance (Gm·tox) compares very well with reported data for InGaAs n-MOSFETs formed on bulk InP substrates, and is significantly higher than reported data for In0.53Ga0.47As n-MOSFETs fabricated on Si substrates using a similar growth technique. |
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School of Electrical and Electronic Engineering |
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School of Electrical and Electronic Engineering Ivana Subramanian, Sujith Owen, Man Hon Samuel Tan, Kian Hua Loke, Wan Khai Wicaksono, Satrio Yoon, Soon Fatt Yeo, Yee-Chia |
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Article |
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Ivana Subramanian, Sujith Owen, Man Hon Samuel Tan, Kian Hua Loke, Wan Khai Wicaksono, Satrio Yoon, Soon Fatt Yeo, Yee-Chia |
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Ivana |
title |
N-channel InGaAs field-effect transistors formed on germanium-on-insulator substrates |
title_short |
N-channel InGaAs field-effect transistors formed on germanium-on-insulator substrates |
title_full |
N-channel InGaAs field-effect transistors formed on germanium-on-insulator substrates |
title_fullStr |
N-channel InGaAs field-effect transistors formed on germanium-on-insulator substrates |
title_full_unstemmed |
N-channel InGaAs field-effect transistors formed on germanium-on-insulator substrates |
title_sort |
n-channel ingaas field-effect transistors formed on germanium-on-insulator substrates |
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2013 |
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https://hdl.handle.net/10356/98835 http://hdl.handle.net/10220/12545 |
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1681035455870533632 |