Goodness-of-fit tests based on P-P probability plots

Technometrics

Saved in:
Bibliographic Details
Main Authors: Gan, F.F., Koehler, K.J.
Other Authors: MATHEMATICS
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/103349
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
Description
Summary:Technometrics