Goodness-of-fit tests based on P-P probability plots
Technometrics
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sg-nus-scholar.10635-1033492015-02-17T03:38:26Z Goodness-of-fit tests based on P-P probability plots Gan, F.F. Koehler, K.J. MATHEMATICS Technometrics 32 3 289-303 TCMTA 2014-10-28T02:36:09Z 2014-10-28T02:36:09Z 1990-08 Article Gan, F.F.,Koehler, K.J. (1990-08). Goodness-of-fit tests based on P-P probability plots. Technometrics 32 (3) : 289-303. ScholarBank@NUS Repository. 00401706 http://scholarbank.nus.edu.sg/handle/10635/103349 NOT_IN_WOS Scopus |
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MATHEMATICS Gan, F.F. Koehler, K.J. |
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Gan, F.F. Koehler, K.J. |
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Gan, F.F. Koehler, K.J. Goodness-of-fit tests based on P-P probability plots |
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Gan, F.F. |
title |
Goodness-of-fit tests based on P-P probability plots |
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Goodness-of-fit tests based on P-P probability plots |
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Goodness-of-fit tests based on P-P probability plots |
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Goodness-of-fit tests based on P-P probability plots |
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Goodness-of-fit tests based on P-P probability plots |
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goodness-of-fit tests based on p-p probability plots |
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2014 |
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