Goodness-of-fit tests based on P-P probability plots

Technometrics

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Main Authors: Gan, F.F., Koehler, K.J.
Other Authors: MATHEMATICS
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/103349
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-1033492015-02-17T03:38:26Z Goodness-of-fit tests based on P-P probability plots Gan, F.F. Koehler, K.J. MATHEMATICS Technometrics 32 3 289-303 TCMTA 2014-10-28T02:36:09Z 2014-10-28T02:36:09Z 1990-08 Article Gan, F.F.,Koehler, K.J. (1990-08). Goodness-of-fit tests based on P-P probability plots. Technometrics 32 (3) : 289-303. ScholarBank@NUS Repository. 00401706 http://scholarbank.nus.edu.sg/handle/10635/103349 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description Technometrics
author2 MATHEMATICS
author_facet MATHEMATICS
Gan, F.F.
Koehler, K.J.
format Article
author Gan, F.F.
Koehler, K.J.
spellingShingle Gan, F.F.
Koehler, K.J.
Goodness-of-fit tests based on P-P probability plots
author_sort Gan, F.F.
title Goodness-of-fit tests based on P-P probability plots
title_short Goodness-of-fit tests based on P-P probability plots
title_full Goodness-of-fit tests based on P-P probability plots
title_fullStr Goodness-of-fit tests based on P-P probability plots
title_full_unstemmed Goodness-of-fit tests based on P-P probability plots
title_sort goodness-of-fit tests based on p-p probability plots
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/103349
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